Electrical Characterization of Thin Layer Materials: Destructive and Non-Destructive Irreversible Processes in Langmuir Films

  • Drahoslav Barancok
  • Julius Cirak
  • Pavol Tomcik
  • Jan Vajda
  • Martin Weis
Keywords: no keywords

Abstract

Summary Well-defined Langmuir-Blodgett films prepared by reproducible technique are still highly attractive for exploitation in investigation of subjects as diverse as chain packing, phase transitions, two-dimensional physics, biosensors and membrane physics. During last 15 years the Maxwell displacement current (MDC) measuring technique was developed for dynamic study of monolayers. In experiment MDC flows through the metal electrode/air gap/Langmuir monolayer/water surface structure. Spontaneous formation of the monolayer was observed and significant differences between destructive and non-destructive processes are discussed.

Author Biographies

Drahoslav Barancok

Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovak Republic

Julius Cirak

Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovak Republic

Pavol Tomcik

Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovak Republic

Jan Vajda

Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovak Republic

Martin Weis

Faculty of Electrical Engineering and Information Technology, Slovak University of Technology, Bratislava, Slovak Republic

Published
2006-03-31
How to Cite
Barancok, D., Cirak, J., Tomcik, P., Vajda, J., & Weis, M. (2006). Electrical Characterization of Thin Layer Materials: Destructive and Non-Destructive Irreversible Processes in Langmuir Films. Communications - Scientific Letters of the University of Zilina, 8(1), 10-12. Retrieved from http://journals.uniza.sk/index.php/communications/article/view/1171
Issue
Vol 8 No 1 (2006)
Section
Articles